Synchrotron radiation induced TXRF
نویسندگان
چکیده
منابع مشابه
Synchrotron radiation induced TXRF†
The use of synchrotron radiation (SR) as an excitation source for total reflection X-ray fluorescence analysis (TXRF) offers several advantages over X-ray tube excitation. Detection limits in the fg range can be achieved with efficient excitation for low Z as well as high Z elements due to the features of synchrotron radiation and in particular the high brilliance in a wide spectral range and t...
متن کاملRecent Advances and Perspectives in Synchrotron Radiation TXRF
Total reflection x-ray fluorescence (TXRF) using Synchrotron Radiation is likely to be the most powerful non-destructive technique for the analysis of trace metal impurities on silicon wafer surfaces. Of fundamental importance in TXRF is the achievable sensitivity as characterized by the minimum detection limit. This work describes the progress we achieved recently at the Stanford Synchrotron R...
متن کاملApplication of synchrotron-radiation-induced TXRF-XANES for arsenic speciation in cucumber (Cucumis sativus L.) xylem sap
1 Atominstitut, Vienna University of Technology, 1020 Wien, Austria 2 ITC-irst, via Sommarive 18, 38050 Povo (Trento) Italy 3 Joint Research Group of Environmental Chemistry of Hungarian Academy of Sciences and L. Eötvös University, Budapest, Hungary 4 Department of Plant Physiology, L. Eötvös University, Budapest, Hungary 5 Department of Chemistry, University of Hamburg, 20146 Hamburg, Germany...
متن کاملApplication of Synchrotron Radiation to TXRF analysis of metal contamination on silicon wafer surfaces
Synchrotron Radiation based Total Reflection X-ray Fluorescence (TXRF) has been shown to meet the critical needs of the semiconductor industry for the analysis of transition metal impurities on silicon wafer surfaces. The current best detection limit achieved at the Stanford Synchrotron Radiation Laboratory (SSRL) for Ni is 8 x 10 atoms/cm which is a factor of 50 better than what can be achieve...
متن کاملSynchrotron Radiation and Pretzeled Orbits Geometry of Synchrotron Radiation Illumination
Turning on a `pretzel' , or any closed orbit distortion, can substantially alter the path of synchrotron radiation (SR), in some instances causing it to strike components not designed to absorb the radiation. In this paper I develop equations useful in determining the source position and angle of dipole SR as a function of the pretzel amplitude and angle. Formula for linear power deposition and...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Journal of Analytical Atomic Spectrometry
سال: 2008
ISSN: 0267-9477,1364-5544
DOI: 10.1039/b719508g